Can we evaluate the CMOS cross section?

Answer 1

Yes, the CMOS cross section can be evaluated through various methods, including simulation tools like TCAD (Technology Computer-Aided Design) and by using analytical models. These techniques allow for the analysis of the device's physical and electrical characteristics, such as doping profiles and electric fields. Additionally, experimental methods like scanning electron microscopy (SEM) can provide insights into the device structure. Evaluating the cross section is crucial for understanding performance metrics and optimizing the fabrication process.